ИСПОЛЬЗОВАНИЕ ЗОНДОВОГО МИКРОСКОПА В ПРОЦЕССЕ ОБУЧЕНИЯ - Студенческий научный форум

VII Международная студенческая научная конференция Студенческий научный форум - 2015

ИСПОЛЬЗОВАНИЕ ЗОНДОВОГО МИКРОСКОПА В ПРОЦЕССЕ ОБУЧЕНИЯ

Брагин М.И. 1, Гилев Д.Ю. 1, Тюрина С.Ю. 1
1Ивановский государственный энергетический университет имени В.И. Ленина
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The aim of this paper is to tell about application of a probe microscope in the education process.

Modern educational process demands that students of high school have not only excellent theoretical knowledge, but also have practical skills. It will provide integration into the new world of higher education. Practical knowledge to work with any tools and instruments related to the natural sciences is very important. Especially these skills are essential in such a multidisciplinary field as nanotechnology.

Thus, the paper deals with the description of a scanning probe microscope that recently appeared in Electro mechanical department of ISPU (Figure 1). Its specifications are the following. It accuracy is 10 nanometers. 1 nm is 1000 times less than 1 micron. For example, one hair is about 100 microns. The fact is that this microscope is different from the usual method of probing the object. The needle that touches the sample can not be seen.

Scanning probe microscope has entered the world market in 2011. It attracted great attention in the international market and immediately won the prestigious American award R&G 100 for the best scientific development in 2011.

Fig. 1. Scanning probe microscope

Thanks to a scanning probe microscope, experiments with individual molecules and atoms recently seemed fantastic now become very real, even conventional, not only for fundamental research but also for applied research in nanotechnology.

The wafer-thin needle mounted in a scanning probe microscope, the ability to recognize patterns of nanometer size and a special camera scans them. The samples to be used are semiconductor hybrid film circuits and elements of the laser drive. With the help of a scanning probe microscope, we can measure the width, height, thickness, and electrical properties of the scanned material and create a visual image of the areas of interest in three-dimensional space. Integrated digital camcorder helps to select the desired portion of the sample, while controlling the state of the probe and the process of moving over the surface of the sample.

With this equipment, you can perform several types of lithography - STM lithography, anodic oxidation lithography, AFM force lithography.

With STM nanolithography we can carry out a series of operations: the surface modification, the transfer of the probe material to the sample and vice versa, the transfer of sample material to the probe.

Self-method of treating the surface is applied to the sample of the current pulse. The surface of the sample under the probe thus may even partially melt and evaporate.

Fig. 2. The sample is made by electron beam lithography

The sample, which you can see in Figure 2, is made by electron beam lithography - plated aluminum at different angles of the films through a special mask from Germany. This object is rather complicated and composed of various elements.

Thereby changing the parameters of the artificial atom and its connection with the external elements we can form "their" energy levels that are different from those created by nature in atoms. The created atom can be used as an element of superconducting nanoelements electronics.

Thus, introduction of a probe microscope into the education process is really important for students.

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